Abstract

Poka-yoke is a quality assurance technique developed by Shigeo Shingo in the 1960s. It is based on the theory that errors and defects have a cause and effect relationship. A defect is purely the effect of an error and by employing poka-yoke devices within processes to remove errors, defects can also be eliminated. The use of poka-yoke has made a significant contribution to organisations' ability to effectively control their core manufacturing processes but little attention has been given to the mistake-proofing of the surrounding administration or support processes. This thesis provides a definition of "administration" and justifies the need for defect prevention within that environment. Poka-yoke is proposed as a possible solution. Existing methods and tools for the identification and development of poka-yoke devices are examined and, by combining key elements of these with methods that address their shortcomings, an alternative Framework for the Development of Poka-Yoke Devices is suggested. The transfer of technologies into non-traditional environments is also considered. Borrowing from Crosby's "Quality Management Maturity Grid", the Technology Transfer Maturity Grid is suggested as a tool for the assessment of the potential success of a transfer prior to the commitment of resources. Validation of this Grid is achieved by its use in correctly predicting the outcome of the transfer of poka-yoke into three case study scenarios encompassing both manufacturing and administration processes. The Framework for the Development of Poka-Yoke Devices is validated by its use within these same case study scenarios. Results from these case studies indicate that the systematic development of poka-yoke in administration is possible, although it is unlikely that its use within that environment can completely satisfy Shingo's statement that "defects = 0 is absolutely possible".

Document Type

Thesis

Publication Date

2022-01-01

Embargo Period

2024-06-21

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