Guest editorial: Characterisation of crack tip fields-CCTF5

Authors

Michael Vormwald, Technische Universität Darmstadt
Neil James, School of Engineering, Computing and Mathematics
Youshi Hong, Chinese Academy of Sciences
Luca Susmel, University of Sheffield
Francesco Iacoviello, University of Cassino and Southern Lazio

DOI Link

10.1016/j.ijfatigue.2020.105618

DOI

10.1016/j.ijfatigue.2020.105618

Publication Date

2020-01-01

Publication Title

International Journal of Fatigue

Volume

140

ISSN

0142-1123

Embargo Period

2021-11-16

Recommended Citation

Vormwald, M., James, N., Hong, Y., Susmel, L., & Iacoviello, F. (2020) 'Guest editorial: Characterisation of crack tip fields-CCTF5', International Journal of Fatigue, 140. Available at: 10.1016/j.ijfatigue.2020.105618