Guest editorial: Characterisation of crack tip fields 3

Authors

L Susmel
MN James, School of Engineering, Computing and Mathematics
Y Hong
F Iacoviello

DOI Link

10.1016/j.ijfatigue.2016.03.031

DOI

10.1016/j.ijfatigue.2016.03.031

Publication Date

2016-01-01

Recommended Citation

Susmel, L., James, M., Hong, Y., & Iacoviello, F. (2016) 'Guest editorial: Characterisation of crack tip fields 3', Available at: 10.1016/j.ijfatigue.2016.03.031