DOI
10.1017/s1431927619005324
Publication Date
2019-08-05
Publication Title
Microscopy and Microanalysis
Volume
25
Issue
S2
Publisher
Cambridge University Press (CUP)
ISSN
1435-8115
Embargo Period
2024-11-25
First Page
918
Last Page
919
Recommended Citation
Volkenandt, T., Pérez-Willard, F., Bauer, F., Stephen, N., & et al. (2019) 'A Fast and Accurate Workflow for Analytic 3D FIB-SEM Tomography', Microscopy and Microanalysis, 25(S2), pp. 918-919. Cambridge University Press (CUP): Available at: https://doi.org/10.1017/s1431927619005324