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dc.contributor.authorVormwald, Men
dc.contributor.authorJames, Nen
dc.contributor.authorHong, Yen
dc.contributor.authorSusmel, Len
dc.contributor.authorIacoviello, Fen
dc.date.accessioned2021-11-10T15:33:53Z
dc.date.available2021-11-10T15:33:53Z
dc.date.issued2020-11en
dc.identifier.issn0142-1123en
dc.identifier.other105618en
dc.identifier.urihttp://hdl.handle.net/10026.1/18311
dc.languageenen
dc.language.isoenen
dc.publisherElsevier BVen
dc.titleGuest editorial: Characterisation of crack tip fields-CCTF5en
dc.typeJournal Article
plymouth.volume140en
plymouth.journalInternational Journal of Fatigueen
dc.identifier.doi10.1016/j.ijfatigue.2020.105618en
plymouth.organisational-group/Plymouth
plymouth.organisational-group/Plymouth/Faculty of Science and Engineering
plymouth.organisational-group/Plymouth/Faculty of Science and Engineering/School of Engineering, Computing and Mathematics
plymouth.organisational-group/Plymouth/Users by role
plymouth.organisational-group/Plymouth/Users by role/Academics
dcterms.dateAccepted2020-01-01en
dc.rights.embargodate2021-11-16en
dc.rights.embargoperiodNot knownen
rioxxterms.versionofrecord10.1016/j.ijfatigue.2020.105618en
rioxxterms.licenseref.urihttp://www.rioxx.net/licenses/all-rights-reserveden
rioxxterms.licenseref.startdate2020-11en
rioxxterms.typeJournal Article/Reviewen


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