A Fast and Accurate Workflow for Analytic 3D FIB-SEM Tomography

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Date
2019-08-05
Author
Volkenandt, T
Pérez-Willard, F
Bauer, F
Stephen, N
Goulden, J
Trimby, P
Larsen, K
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URI
http://hdl.handle.net/10026.1/16839
DOI
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Publisher
Cambridge University Press (CUP)
Journal
Microscopy and Microanalysis
Volume
25
Issue
S2
Pagination
918 - 919

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