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dc.contributor.authorSusmel, Len
dc.contributor.authorJames, MNen
dc.contributor.authorHong, Yen
dc.contributor.authorIacoviello, Fen
dc.date.accessioned2018-01-09T10:11:55Z
dc.date.available2018-01-09T10:11:55Z
dc.date.issued2016-01-01en
dc.identifier.issn0142-1123en
dc.identifier.urihttp://hdl.handle.net/10026.1/10508
dc.format.extent1 - ?en
dc.language.isoenen
dc.titleGuest editorial: Characterisation of crack tip fields 3en
dc.typeOther
plymouth.volume89en
plymouth.publication-statusPublisheden
plymouth.journalInternational Journal of Fatigueen
dc.identifier.doi10.1016/j.ijfatigue.2016.03.031en
plymouth.organisational-group/Plymouth
plymouth.organisational-group/Plymouth/Faculty of Science and Engineering
plymouth.organisational-group/Plymouth/Faculty of Science and Engineering/School of Engineering, Computing and Mathematics
plymouth.organisational-group/Plymouth/Users by role
plymouth.organisational-group/Plymouth/Users by role/Academics
dc.rights.embargoperiodNot knownen
rioxxterms.versionofrecord10.1016/j.ijfatigue.2016.03.031en
rioxxterms.licenseref.urihttp://www.rioxx.net/licenses/all-rights-reserveden
rioxxterms.typeOtheren


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